Built-in performance characterization of embedded mixed-signal circuits

Built-in performance characterization of embedded mixed-signal circuits

Not available

Bibliographic Details
Main Author: Shin, Hongjoong
Other Authors: Abraham, Jacob A.
Format: Others
Language:English
Published: 2008
Subjects:
Mixed signal circuits > Testing
Automatic test equipment
Online Access:http://hdl.handle.net/2152/3485

Internet

http://hdl.handle.net/2152/3485

Similar Items