Parametric testing, characterization and reliability of integrated circuits

Parametric testing, characterization and reliability of integrated circuits

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Bibliographic Details
Main Author: Datta, Ramyanshu
Format: Others
Language:English
Published: 2008
Subjects:
Integrated circuits > Testing
Integrated circuits > Reliability
Integrated circuits > Design and construction
Integrated circuits > Defects
Online Access:http://hdl.handle.net/2152/2855

Internet

http://hdl.handle.net/2152/2855

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