Characterization and management of voltage noise in multi-core, multi-threaded processors
Reliability is one of the important issues of recent microprocessor design. Processors must provide correct behavior as users expect, and must not fail at any time. However, unreliable operation can be caused by excessive supply voltage fluctuations due to an inductive part in a microprocessor pow...
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| Format: | Others |
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2014
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| Online Access: | http://hdl.handle.net/2152/25185 |