A SEIR-based ADC built-in-self-test and its application in ADC self-calibration
The static linearity test is one of the fundamental production tests used to measure DC performance of analog to digital converters (ADCs). It comes with high test equipment cost. An ADC built-in-self-test (BIST) is an attractive solution. However the stringent linearity requirement for an on-chip s...
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| Format: | Others |
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2014
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| Online Access: | http://hdl.handle.net/2152/24051 |