Techniques to minimize circuitry and improve efficiency for defect tolerance
As technology continues to scale to smaller geometries and newer dimensions (3-D), with increasingly complex manufacturing processes, the ability to reliably manufacture 100% defect-free circuitry becomes a significant challenge. While implementing additional circuitry to improve yield is economical...
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| Format: | Others |
| Language: | en_US |
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2013
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| Online Access: | http://hdl.handle.net/2152/21926 |