Test plan generation technique for complex integrated circuits

Not available === text

Bibliographic Details
Main Author:	Lee, Songjun
Format:	Others
Language:	English
Published:	2011
Subjects:	Integrated circuits > Testing Integrated circuits > Design and construction > Cost effectiveness
Online Access:	http://hdl.handle.net/2152/11614

id	ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-11614
record_format	oai_dc
spelling	ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-116142015-09-20T16:59:54ZTest plan generation technique for complex integrated circuitsLee, SongjunIntegrated circuits--TestingIntegrated circuits--Design and construction--Cost effectivenessNot availabletext2011-06-09T21:47:57Z2011-06-09T21:47:57Z2002-122011-06-09electronichttp://hdl.handle.net/2152/11614engCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.Restricted
collection	NDLTD
language	English
format	Others
sources	NDLTD
topic	Integrated circuits--Testing Integrated circuits--Design and construction--Cost effectiveness
spellingShingle	Integrated circuits--Testing Integrated circuits--Design and construction--Cost effectiveness Lee, Songjun Test plan generation technique for complex integrated circuits
description	Not available === text
author	Lee, Songjun
author_facet	Lee, Songjun
author_sort	Lee, Songjun
title	Test plan generation technique for complex integrated circuits
title_short	Test plan generation technique for complex integrated circuits
title_full	Test plan generation technique for complex integrated circuits
title_fullStr	Test plan generation technique for complex integrated circuits
title_full_unstemmed	Test plan generation technique for complex integrated circuits
title_sort	test plan generation technique for complex integrated circuits
publishDate	2011
url	http://hdl.handle.net/2152/11614
work_keys_str_mv	AT leesongjun testplangenerationtechniqueforcomplexintegratedcircuits
_version_	1716821479131185153

Test plan generation technique for complex integrated circuits

Similar Items