Test plan generation technique for complex integrated circuits

Test plan generation technique for complex integrated circuits

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Bibliographic Details
Main Author: Lee, Songjun
Format: Others
Language:English
Published: 2011
Subjects:
Integrated circuits > Testing
Integrated circuits > Design and construction > Cost effectiveness
Online Access:http://hdl.handle.net/2152/11614

Internet

http://hdl.handle.net/2152/11614

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