Cost-effective test at system-level
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2011
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| Online Access: | http://hdl.handle.net/2152/11601 |
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ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-116012015-09-20T16:59:54ZCost-effective test at system-levelKim, Hyun-moo, 1970-Electronic circuits--Testing--Cost effectivenessElectronic circuit design--Economic aspectsNot availabletext2011-06-09T21:10:10Z2011-06-09T21:10:10Z2002-122011-06-09electronichttp://hdl.handle.net/2152/11601engCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works. |
| collection |
NDLTD |
| language |
English |
| format |
Others
|
| sources |
NDLTD |
| topic |
Electronic circuits--Testing--Cost effectiveness Electronic circuit design--Economic aspects |
| spellingShingle |
Electronic circuits--Testing--Cost effectiveness Electronic circuit design--Economic aspects Kim, Hyun-moo, 1970- Cost-effective test at system-level |
| description |
Not available === text |
| author |
Kim, Hyun-moo, 1970- |
| author_facet |
Kim, Hyun-moo, 1970- |
| author_sort |
Kim, Hyun-moo, 1970- |
| title |
Cost-effective test at system-level |
| title_short |
Cost-effective test at system-level |
| title_full |
Cost-effective test at system-level |
| title_fullStr |
Cost-effective test at system-level |
| title_full_unstemmed |
Cost-effective test at system-level |
| title_sort |
cost-effective test at system-level |
| publishDate |
2011 |
| url |
http://hdl.handle.net/2152/11601 |
| work_keys_str_mv |
AT kimhyunmoo1970 costeffectivetestatsystemlevel |
| _version_ |
1716821475396157440 |