Cost-effective test at system-level

Cost-effective test at system-level

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Bibliographic Details
Main Author: Kim, Hyun-moo, 1970-
Format: Others
Language:English
Published: 2011
Subjects:
Electronic circuits > Testing > Cost effectiveness
Electronic circuit design > Economic aspects
Online Access:http://hdl.handle.net/2152/11601

Internet

http://hdl.handle.net/2152/11601

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