Self-Healing Cellular Automata to Correct Soft Errors in Defective Embedded Program Memories
Static Random Access Memory (SRAM) cells in ultra-low power Integrated Circuits (ICs) based on nanoscale Complementary Metal Oxide Semiconductor (CMOS) devices are likely to be the most vulnerable to large-scale soft errors. Conventional error correction circuits may not be able to handle the distri...
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| Format: | Others |
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DigitalCommons@USU
2009
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| Online Access: | https://digitalcommons.usu.edu/etd/509 https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=1505&context=etd |