Total Internal Reflection Holographic Microscopy (TIRHM) for Quantitative Phase Characterization of Cell-Substrate Adhesion
Total Internal Reflection Holographic Microscopy (TIRHM) combines near-field microscopy with digital holography to produce a new form of near-field phase microscopy. Using a prism in TIR as a near-field imager, the presence of microscopic organisms, cell-substrate interfaces, and adhesions, causes r...
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| Format: | Others |
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Scholar Commons
2010
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| Online Access: | https://scholarcommons.usf.edu/etd/1564 https://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=2563&context=etd |