Fault Tolerant Design Verification Through The Use of Laser Fault Injection
Laser Fault Injection (LFI) testing has been demonstrated to be a useful tool in the prediction of single event upset rates in microcircuits. In addition LFI has contributed to the basic understanding of the mechanisms that cause single event upsets. However, very little research has been performed...
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| Format: | Others |
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Scholar Commons
2004
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| Online Access: | https://scholarcommons.usf.edu/etd/1302 https://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=2301&context=etd |