Mechanical support design of analyzer for a diffraction enhanced x-ray imaging (DEI) system

Mechanical support design of analyzer for a diffraction enhanced x-ray imaging (DEI) system

Diffraction Enhanced X-ray Imaging (DEI) uses synchrotron X-ray beams prepared and analyzed by perfect single crystals to achieve imaging contrast from a number of phenomena taking place in an object under investigation. The crystals used in DEI for imaging requires high precision positioning due to...

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Bibliographic Details
Main Author: Alagarsamy, Nagarajan
Other Authors: Zhang, W. J. (Chris)
Format: Others
Language:en
Published: University of Saskatchewan 2007
Subjects:
Diffraction Enhanced X-ray Imaging (DEI)
Analyzer
Mechanical support design
Finite Element Analysis (FEA)
Modal analysis
Online Access:http://library.usask.ca/theses/available/etd-05172007-160800/

Internet

http://library.usask.ca/theses/available/etd-05172007-160800/

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