Tailoring Properties of Materials at the Nanoscale
The knowledge of growth and characterizing techniques is essential for the preparation of high quality thin films and multilayers. Here, structural properties have been investigated by X-ray reflectivity, X-ray diffraction, and transmission electron microscopy while the composition was determined by...
| Main Author: | |
|---|---|
| Format: | Doctoral Thesis |
| Language: | English |
| Published: |
Uppsala universitet, Materialfysik
2009
|
| Subjects: | |
| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-107425 http://nbn-resolving.de/urn:isbn:978-91-554-7584-0 |