Delay-Fault BIST in Low-Power CMOS Devices
Devices such as microcontrollers are often required to operate across a wide range of voltage and temperature. Delay variation in different temperature and voltage corners can be large, and for deep submicron geometries delay faults are more likely than for larger geometries. This has made delay fau...
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| Format: | Others |
| Language: | English |
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Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon
2008
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-8877 |