High-Level Test Generation and Built-In Self-Test Techniques for Digital Systems
The technological development is enabling production of increasingly complex electronic systems. All those systems must be verified and tested to guarantee correct behavior. As the complexity grows, testing is becoming one of the most significant factors that contribute to the final product cost. Th...
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| Format: | Others |
| Language: | English |
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Linköpings universitet, ESLAB - Laboratoriet för inbyggda system
2002
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-5728 http://nbn-resolving.de/urn:isbn:917373442X |