Nanocrystalline Alumina-Zirconia Thin Films Grown by Magnetron Sputtering

Alumina-zirconia thin films have been deposited using dual magnetron sputtering. Film growth was performed at relatively low-to-medium temperatures, ranging from ~300°C to 810 °C. Different substrates were applied, including silicon (100), and industrially relevant materials, such as WC-Co hardmetal...

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Bibliographic Details
Main Author: Trinh, David Huy
Format: Doctoral Thesis
Language:English
Published: Linköpings universitet, Tunnfilmsfysik 2008
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-17529
http://nbn-resolving.de/urn:isbn:978-91-85895-18-2