Sampling Ocsilloscope On-Chip

Sampling Ocsilloscope On-Chip

Signal-integrity degradation from such factors as supply and substrate noise and cross talk between interconnects restricts the performance advances in Very Large Scale Integration (VLSI). To avoid this and to keep the signal-integrity, accurate measurements of the on-chip signal must be performed t...

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Bibliographic Details
Main Author: Forsgren, Niklas
Format: Others
Language:English
Published: Linköpings universitet, Institutionen för systemteknik 2003
Subjects:
Electronics
sampling
high-speed sampling
subsampling
sampling oscilloscope on-chip
source follower
common source
sampling switch
transmission gate
sample and hold
track and hold
MOS transistor
Elektronik
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-1563

Internet

http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-1563

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