Growth and XRD Characterization of Quasicrystals in AlCuFe and Nanoflex Thin Films

Growth and XRD Characterization of Quasicrystals in AlCuFe and Nanoflex Thin Films

Quasicrystals is a new kind of material that have several interesting aspects to it. The unusual atomic structure entails many anomalous and unique physical properties, for example, high hardness, and extremely low electrical and thermal conductivity. In thin films quasicrystals would enable new fun...

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Bibliographic Details
Main Author: Olsson, Simon
Format: Others
Language:English
Published: Linköpings universitet, Institutionen för fysik, kemi och biologi 2008
Subjects:
Quasicrystals
Approximant
AlCuFe
Nanoflex
Thin Film
Magnetron Sputtering
XRD
EDX
Material physics with surface physics
Materialfysik med ytfysik
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-15140

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http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-15140

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