Thermal Issues in Testing of Advanced Systems on Chip
Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. Such very large scale integration is enabled...
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| Format: | Doctoral Thesis |
| Language: | English |
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Linköpings universitet, Institutionen för datavetenskap
2015
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-120798 http://nbn-resolving.de/urn:isbn:978-91-7685-949-0 (print) |