First-principle of Sc / Cr multilayers for x-ray mirrors applications
In order to produce x-ray mirrors the Thin Film Physics group at IFM grows Cr/Sc multilayers, with a typical thickness of the individual layers in the range 5-20 Å, and with as many periods as possible (a few hundred). The quality of the multilayer interfaces is crucial for their performance as mirr...
| Main Author: | |
|---|---|
| Format: | Others |
| Language: | English |
| Published: |
Linköpings universitet, Institutionen för fysik, kemi och biologi
2008
|
| Subjects: | |
| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-11780 |