Event-based High Resolution X-ray Imaging using Compton Coincidence Detection
Research on photon counting detectors (PCDs) is focused on semiconductor materials, and silicon is a strong candidate to use in PCDs for photon counting computer tomography (CT). In a silicon detector, a significant portion of the counts is due to Compton scattering events. Since only part of the in...
| Main Author: | |
|---|---|
| Format: | Others |
| Language: | English |
| Published: |
KTH, Medicinsk avbildning
2021
|
| Subjects: | |
| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-303400 |