Characterization and Failure Analysis of X-Ray Detector Diodes
This master thesis report consists in the characterization of silicon diodes for radiation dosimetry and the investigation of their failure. An overview on the semiconductor properties in radiation detectors is presented to give physical basis to the successive analysis. Then the experimental setups...
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| Format: | Others |
| Language: | Swedish |
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KTH, Skolan för informations- och kommunikationsteknik (ICT)
2014
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-177342 |