On Parameter Estimation Employing Sinewave Fit andPhase Noise Compensation in OFDM Systems

In today’s modern society, we are surrounded by a multitude of digital devices.The number of available digital devices is set to grow even more. As the trendcontinues, product life-cycle is a major issue in mass production of these devices.Testing and verification is responsible for a significant pe...

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Bibliographic Details
Main Author: Negusse, Senay
Format: Doctoral Thesis
Language:English
Published: KTH, Signalbehandling 2015
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-168179
http://nbn-resolving.de/urn:isbn:978-91-7595-624-4