Fault tolerant nanoscale microprocessor design on semiconductor nanowire grids

As CMOS manufacturing technology approaches fundamental limits, researchers are looking for revolutionary technologies beyond the end of the CMOS roadmap. Recent progress on devices, nano-manufacturing, and assembling of nanoscale structures is driving researchers to explore possible new fabrics, ci...

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Bibliographic Details
Main Author: Wang, Teng
Language:ENG
Published: ScholarWorks@UMass Amherst 2009
Subjects:
Online Access:https://scholarworks.umass.edu/dissertations/AAI3349747