Reducing post-silicon coverage monitoring overhead with emulation and statistical analysis
With increasing design complexity, post-silicon validation has become a critical problem. In pre-silicon validation, coverage is the primary metric of validation effectiveness, but in post-silicon, the lack of observability makes coverage measurement problematic. On-chip coverage monitors are a poss...
| Main Author: | |
|---|---|
| Language: | English |
| Published: |
University of British Columbia
2015
|
| Online Access: | http://hdl.handle.net/2429/54393 |