Reliability study of bipolar transistors with metal-insulator-semiconductor heterojunction emitters
Bipolar transistors employing an MIS junction for the emitter exhibit the very desirable properties of high operating frequency and/or high common emitter gains. The topic of this thesis is to investigate the usefulness of the MIS bipolar transistor in real applications. The experimental result...
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| Language: | English |
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University of British Columbia
2012
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| Online Access: | http://hdl.handle.net/2429/42013 |