Time-driven test methodologies for embedded srams
According to International Technology Roadmap for Semiconductor 2003 (ITRS'03), by 2013 over 90% o f the total System-on-a-Chip (SoC) area will be occupied by memories, e.g., SRAMs. The increasingly dense embedded SRAMs (e-SRAMs) are more prone to manufacturing defects and field reliability...
| Main Author: | |
|---|---|
| Language: | English |
| Published: |
2009
|
| Online Access: | http://hdl.handle.net/2429/17145 |