Integrating Wavelet Analysis and Genetic Algorithmwith Support Vector Machine on Non-normal Control Chart Pattern Recognition
碩士 === 國立雲林科技大學 === 工業工程與管理系 === 107 === Statistical process control is an important technology for monitoring industrial processes, and the control chart is the most commonly used method. In order to help practitioners monitor the control charts pattern, quickly identify and improve the symptoms of...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/zmbmu8 |