Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors
碩士 === 國立東華大學 === 電機工程學系 === 107 === In this paper ,we simulate Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors. First, we simulate different gate-source overlap/underlap structures in a fixed source concentration gradient and observe their...
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ndltd-TW-107NDHU54420092019-10-29T05:22:34Z http://ndltd.ncl.edu.tw/handle/33a256 Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors 奈米線穿隧場效電晶體之閘極正交疊/負交疊與源極濃度梯度之模擬 Ching-Ping Cheng 鄭建平 碩士 國立東華大學 電機工程學系 107 In this paper ,we simulate Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors. First, we simulate different gate-source overlap/underlap structures in a fixed source concentration gradient and observe their I-V characteristics. Next, we simulated five different SDGs for each gate-source overlap/underlap structure and observed their device characteristics. The simulation results show that gate-source overlap structure has better device characteristics than gate-source underlap structure, but the device characteristics do not significantly improve with the increase of the overlap length. On the other hand, the SDG has Hardly affected on the device characteristics in the gate-source overlap structure, and the larger the SDG in the gate-source underlap structure, the better the device characteristics. Keng-Ming Liu 劉耿銘 2019 學位論文 ; thesis 93 zh-TW |
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碩士 === 國立東華大學 === 電機工程學系 === 107 === In this paper ,we simulate Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors.
First, we simulate different gate-source overlap/underlap structures in a fixed source concentration gradient and observe their I-V characteristics.
Next, we simulated five different SDGs for each gate-source overlap/underlap structure and observed their device characteristics.
The simulation results show that gate-source overlap structure has better device characteristics than gate-source underlap structure, but the device characteristics do not significantly improve with the increase of the overlap length.
On the other hand, the SDG has Hardly affected on the device characteristics in the gate-source overlap structure, and the larger the SDG in the gate-source underlap structure, the better the device characteristics.
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author2 |
Keng-Ming Liu |
author_facet |
Keng-Ming Liu Ching-Ping Cheng 鄭建平 |
author |
Ching-Ping Cheng 鄭建平 |
spellingShingle |
Ching-Ping Cheng 鄭建平 Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors |
author_sort |
Ching-Ping Cheng |
title |
Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors |
title_short |
Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors |
title_full |
Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors |
title_fullStr |
Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors |
title_full_unstemmed |
Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors |
title_sort |
simulation of gate overlap/underlap and source doping gradient of nanowire tunnel field-effect transistors |
publishDate |
2019 |
url |
http://ndltd.ncl.edu.tw/handle/33a256 |
work_keys_str_mv |
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