Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors

碩士 === 國立東華大學 === 電機工程學系 === 107 === In this paper ,we simulate Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors. First, we simulate different gate-source overlap/underlap structures in a fixed source concentration gradient and observe their...

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Main Authors: Ching-Ping Cheng, 鄭建平
Other Authors: Keng-Ming Liu
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/33a256
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spelling ndltd-TW-107NDHU54420092019-10-29T05:22:34Z http://ndltd.ncl.edu.tw/handle/33a256 Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors 奈米線穿隧場效電晶體之閘極正交疊/負交疊與源極濃度梯度之模擬 Ching-Ping Cheng 鄭建平 碩士 國立東華大學 電機工程學系 107 In this paper ,we simulate Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors. First, we simulate different gate-source overlap/underlap structures in a fixed source concentration gradient and observe their I-V characteristics. Next, we simulated five different SDGs for each gate-source overlap/underlap structure and observed their device characteristics. The simulation results show that gate-source overlap structure has better device characteristics than gate-source underlap structure, but the device characteristics do not significantly improve with the increase of the overlap length. On the other hand, the SDG has Hardly affected on the device characteristics in the gate-source overlap structure, and the larger the SDG in the gate-source underlap structure, the better the device characteristics. Keng-Ming Liu 劉耿銘 2019 學位論文 ; thesis 93 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立東華大學 === 電機工程學系 === 107 === In this paper ,we simulate Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors. First, we simulate different gate-source overlap/underlap structures in a fixed source concentration gradient and observe their I-V characteristics. Next, we simulated five different SDGs for each gate-source overlap/underlap structure and observed their device characteristics. The simulation results show that gate-source overlap structure has better device characteristics than gate-source underlap structure, but the device characteristics do not significantly improve with the increase of the overlap length. On the other hand, the SDG has Hardly affected on the device characteristics in the gate-source overlap structure, and the larger the SDG in the gate-source underlap structure, the better the device characteristics.
author2 Keng-Ming Liu
author_facet Keng-Ming Liu
Ching-Ping Cheng
鄭建平
author Ching-Ping Cheng
鄭建平
spellingShingle Ching-Ping Cheng
鄭建平
Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors
author_sort Ching-Ping Cheng
title Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors
title_short Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors
title_full Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors
title_fullStr Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors
title_full_unstemmed Simulation of gate overlap/underlap and source doping gradient of nanowire Tunnel Field-Effect Transistors
title_sort simulation of gate overlap/underlap and source doping gradient of nanowire tunnel field-effect transistors
publishDate 2019
url http://ndltd.ncl.edu.tw/handle/33a256
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