Study on the Degradation and Recovery of Low Temperature Poly-Si Thin Film Transistors under DC and AC Bias Stress
碩士 === 國立中興大學 === 電機工程學系所 === 107 === The low-temperature polysilicon thin-film transistors have high carrier mobility and driving current, and have the ability to integrate the driving circuits onto the substrate, achieving high brightness, reducing panel manufacturing cost and increasing reliabili...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/cgi-bin/gs32/gsweb.cgi/login?o=dnclcdr&s=id=%22107NCHU5441042%22.&searchmode=basic |