A Fast Defect Detection Method for Band Saw Machines with Deep Learning and Image Processing Technique

碩士 === 國立中興大學 === 資訊科學與工程學系所 === 107 ===   In recent years, the technology of factory automation have become the main current in today '' s world. As the low-birth rate, the problem of population decline and the minimum wage increase occur one after another. Many industries have begun to c...

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Bibliographic Details
Main Authors: Yu-Yi Chiang, 江宥儀
Other Authors: 吳俊霖
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/cgi-bin/gs32/gsweb.cgi/login?o=dnclcdr&s=id=%22107NCHU5394036%22.&searchmode=basic