Constructing Convolutional Neural Networks-based model for Defect Inspection and Empirical Study
碩士 === 元智大學 === 資訊管理學系 === 106 === Defect inspection has become more difficult with the complex process and high product-mix in the manufacturing process of thin film crystal liquid crystal display panel (TFT-LCD). The existing study of defect classification is not easy for the expert through the hu...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3dunqg |