Automatic Inspection of IC Surface Defect in Packaging Process
碩士 === 元智大學 === 資訊工程學系 === 106 === AOI (Automated Optical Inspection, AOI), widely used in the surface of the product Wafer, IC, PCB, PCB ... solar and other production processes in the defect detection, the use of machine vision technology as testing standards, improvement of traditional human use...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/uhaaft |