Study on Performance of Inspectors for Wafer Defect Inspection in Visual Search Direction
碩士 === 元智大學 === 工業工程與管理學系 === 106 === Study on performance of inspectors for wafer defect inspection in visual search direction. Independent variable is visual search direction, throuth individual interview to collect the result of visual inspectors in Fab, and classify to four types, and appear by...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/cb9huk |