The Investigation of The GaN Metal-Semiconductor-Metal Near UV Photodetector with Trench Structure

碩士 === 南臺科技大學 === 電子工程系 === 106 === In this study, the normal metal-semiconductor-metal (MSM) GaN photodetector, named PD1, was fabricated, and its characteristics of I-V, response, and low frequency noise were also measured. Then, two types of MSM photodetectors with trench structures were fabricat...

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Bibliographic Details
Main Authors: SUN, PEI-JYUN, 孫培鈞
Other Authors: WANG, CHUN-KAI
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/mvauav