Study on Reliability of Tri-gate FinFET with Different Active Surface Area(SA) in Hot Carriers Effect and Constant Voltage Stress
碩士 === 國立高雄大學 === 電機工程學系碩博士班 === 106
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/u5yxm8 |