Contour Identification for Label Cutting Machine Based on Sobel Edge Detector and Contour Tracing Scheme
碩士 === 國立宜蘭大學 === 電子工程學系碩士班 === 106 === In recent years, product customization is in great demand, such as custom labels. Because label customizing processes have the high computation complexity and long computation time, they are high cost to generate the label contour. This results in the cost red...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/jbpc6a |