Influence of Defect Density and Buffer Layer Thickness on the Reliability of GaN-based Light Emitting Diodes
碩士 === 國立彰化師範大學 === 光電科技研究所 === 106 === In this thesis, the influence of defect density and buffer layer thickness on the reliability of InGaN light emitting diodes (LEDs) was investigated. First of all, basic electro-optical characteristics of LEDs and operation principle of measurement instruments...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/kw8x25 |