Competitive Strategy of Wafer Probe Card Industry: A Case Study of S Company

• Main Authors: Lee, Chien Chen, 李建成
• Other Authors: Jen, William
• Format: Others
• Language: zh-TW
• Published: 2018
• Online Access: http://ndltd.ncl.edu.tw/handle/xx4z44

碩士 === 國立交通大學 === 管理學院高階主管管理碩士學程 === 106 === The probe card is a test interface used on the test platform of the semiconductor industry test plant. The interface varies with the size of the die, the size of the interval section, and the type of contact surface. With the vigorous development of Taiwan's semiconductor industry and the continuous expansion of the testing plant's capacity, the relative demand for probe card testing is also growing. Before 1990, the supply of probe cards are totally relied on foreign imports. In recent years, the US and Japan pin card test factories directly transferred their production technology and production lines to Taiwan for production. Local Taiwanese manufacturers also formed strategic alliances with foreign manufacturers or Technology transfer mode into production. As a result, the shorter delivery time and the real time of customer service have become one of the important conditions for the competitiveness of this industry. The purpose of the research is to illustrate the competitive strategy and future prospects of the Taiwan wafer test and test probe card industry.