Competitive Strategy of Wafer Probe Card Industry: A Case Study of S Company
碩士 === 國立交通大學 === 管理學院高階主管管理碩士學程 === 106 === The probe card is a test interface used on the test platform of the semiconductor industry test plant. The interface varies with the size of the die, the size of the interval section, and the type of contact surface. With the vigorous development of Taiwa...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/xx4z44 |