Thorough Defect Diagnosis for Reconfigurable Single-Electron Transistor Arrays
碩士 === 國立交通大學 === 電子研究所 === 106 === With the advances of manufacturing processes, power consumption resulting from leakage current is one of the most critical problems in system designs nowadays. There are several emerging nanodevices have been proposed to solve the leakage power issue. The single e...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/6z96zk |