Enhance the Strength of Semiconductor Wafers by Design of Experiments and Response Surface Methodology
碩士 === 國立交通大學 === 管理學院工業工程與管理學程 === 106 === The main purpose of this research is to use the experimental design method to improve the wafer quality characteristics. Since the design direction of electronic products is based on the four requirements of light, thin, short and small. To achieve this go...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/x29yj8 |