Gate Oxide scaling Effect on MOSFETs and TFETs by TCAD Simulations

碩士 === 國立成功大學 === 奈米積體電路工程碩士學位學程 === 106

Bibliographic Details
Main Authors: Khalil urRehman, 尤磊安
Other Authors: Kuo-Hsing Kao
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/4jkkgm