High-Efficiency Test Compression Technology and On-Chip Self-Test Methodology with All Deterministic Compressed Test Patterns Recorded in Low Power Scan Chains
碩士 === 國立成功大學 === 電腦與通信工程研究所 === 106
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2018
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/tnk8rp |