Epitaxial Growth and Characterizations of Topological P-N Junction in Sb2Te3/Bi2Te3 Heterostructures
碩士 === 國立成功大學 === 物理學系 === 106 === Bi2Te3 and Sb2Te3 topological insulator thin films have been successfully grown on Al2O3 (0001) substrates by molecular beam epitaxy (MBE). In-situ reflection high energy electron diffraction (RHEED) and ex-situ atomic force microscopy (AFM) indicate the smooth sur...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/9x69s3 |