TFT-LCD Display Array Photolithography Process Mura Defect Improvement

碩士 === 中原大學 === 電子工程研究所 === 106 === This paper explores TFT-LCD Display Array (Array) Yellow light due to the differences in the design of equipment and products caused by the difference in the brightness of the yellow light process in the uneven mark (Mura) an exception to the. Research is a combin...

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Bibliographic Details
Main Authors: Ting-Wei Chung, 鍾定韋
Other Authors: Wu-Yih Uen
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/3u5f35