Design of High Resolution, Low Measured Jitter Errorand Variation Resilient On-Chip Jitter Sensor for DDR4-3200
碩士 === 國立中正大學 === 電機工程研究所 === 106 === As the technology node progresses and the operating frequency of circuit and system increases, variation’s affection becomes more and more critical, and jitter effect is one of the most severe variations. However, jitter effect is difficult to be measured and qu...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/m36b79 |