Semi-automated Stateful Black-box Fuzzing for IoT Devices

碩士 === 國立中正大學 === 資訊工程研究所 === 107 === As the technology of Internet of Things (IoT) thrives, the security in the IoT network is increasingly important. Some testing tools have been developed to find the vulnerabilities on IoT firmware. While most of the testing frameworks use a white-box testing met...

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Bibliographic Details
Main Authors: CHUNG, YUAN-TE, 鐘元德
Other Authors: LIN, PO-CHING
Format: Others
Language:en_US
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/9etpt7