Study on Resistive Switching Characteristics of ZnSnO Thin Films

碩士 === 國立雲林科技大學 === 電子工程系 === 105 === In this study, the Al-doped zinc tin oxide (Al-ZTO) and zinc tin oxide (ZTO) resistive random access memories (ReRAMs) were fabricated by a simple, fast, low cost, and low temperature solution-process. This thesis was divided into three parts. First, indium...

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Bibliographic Details
Main Authors: CHEN, YU-TING, 陳昱庭
Other Authors: HSU, CHIH-CHIEH
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/qhn36x